ThinLayerAnalysis ThinLayerAnalysis specializes
in the measurement and characterisation of thin films deposited on hard
materials, including plastics. Using techniques like ball
cratering and optical microscopy it is possible to investigate film
thickness, morphology and wear resistance, and to undertake defect
analysis, very rapidly. Often these methods will yield a solution
more rapidly and more easily interpreted than more complex analysis
techniques.
Carefully developed sectioning and polishing techniques can also be
used to delayer multiliayer systems, such as semiconductors, permitting
chemical analysis by other techniques (such as XPS (X-ray Photoelectron
Spectrometry) or SIMS (Secondary Ion Mass Spectrometry)). Many
years of experience in this field permits our specialist sample
preparation to achieve successful analysis where conventional chemical
depth profiling fails; a particular example being backside SIMS
analysis (also called reverse side SIMS), whereby the exposed surface
is analysed from the rear after careful removal of the substrate.
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